Pin Drivers

• Up to 160 Digital Input Pins (Signal Generators).
• Up to 160 Digital Output Pins (Output Detectors).
• 3 Separate Analog Measurement subsystems electrically mapped to any of the 160 I/O pins.
• 8 programmable clocks electrically mapped to any of the 160 I/O pins.
• 4 Vcc Power supplies -2VDC to +8VDC Programmable in .0025V steps +/-.005V.
• 1 Vpp Power supply 0 VDC to +20 VDC Programmable in .0025V steps +/-.005V.
• 1 Active Ground -2.5V to +2.5V Programmable in .0001V steps +/- .0002V.

Functional Test

Tester hardware is electrically reconfigurable: Any I/O pin can be connected to any pattern source or combinations of pattern sources during any given test sequence. User choice of :

• Standard JEDEC test vectors
• Unlimited # of JEDEC Vectors can be used.
• Built-in Fault coverage report.
• Vector clock up to 100 KHz.
• Vector to Vector Step time to 2 milliseconds.
• J-tag (Serial pattern generator)
• Standard tester equipped with 16 Meg RAM for pattern storage.
• Any I/O pin(s) can be programmed or reconfigured under software control.
• Any I/O pin can be used as an Input, Expect, or Mask pin.

Exatron Automatic Test Vector Generator (ATVG)

• Automatic set up, Automatic "learn mode" for all Functional & DC & AC tests.
• Patterns applied at up to 33 million patterns per second.
• Standard pattern test length 100,000 Vectors (test time at 33 MHz = 0.003 seconds)
• Programmable Test Length up to 16,000,000 Vectors (test time at 33 MHz = 0.5 seconds)
• Built-in Fault Coverage report.
• Extensive fault analysis features.

DC Test

• Currents measured to 0.01 MicroAmps with 0.05 MicroAmps repeatability.
• Voltage measured to 0.00005 volts with 0.0001 volt repeatability.
• Leakage Test: Force Voltage/Measure Current.
• Output Voltage High: Force Current/ Measure voltage.
• Input Current (Icc test): Measure DUT supply current.
• Output Short Test: Force Voltage / Measure current.
• Open/Short Poor socket contact and/or Lead bond test: Force voltage / Measure current.
• Other DC tests as per your requirements.

Active DC Test

• Iddq Test: Provides precise test of Iddq at high clock rates.
• "Ground bounce" precise test at high clock rates.

AC Test

• All Pin drivers rise/fall time less than 1.4 nsec. for 3 volts.
• Propagation Delay Test: Measure 0 to 250 nanoseconds, with 50 picosecond repeatability.
• Input threshold to Output threshold.
• Set Up Time Test: Measure 0 to 40 nanoseconds, with 50 picosecond repeatability.
• Signal input threshold to clock threshold.
• Clock to Output Test: Measure 0 to 40 nanoseconds, with 50 picosecond repeatability.
• Clock threshold to Output threshold.
• SKEW: Auto AC Calibration of all 160 I/O pins to 50 picosecond repeatability.
• Other AC Tests as per your requirements.

Docking

• Built-in Docking hardware for any Exatron Handler
• Readily adapts to Most 13" center to center docking plates
• Packaged for direct dock to almost all known Handlers WITHOUT the need for a manipulator
• Package for easy dock to all known Probers

Other

• 66 MegHz Pentium (minimum)
• 16 Meg RAM (minimum)
• Supplied with full function keyboard and Super VGA Color Monitor
• Built-in 3 1/2" floppy disk / 500 Meg Hard Disk (minimum)
• Size: 15" round, 14" tall, Excludes keyboard/monitor